Next: 5.10 Test Data Generator
Up: 5 Programmable Features
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Test mode may be entered by setting a
control bit. In this mode input data to the compactor is taken from FASTBUS
rather than from the input buffers. In this way the compactor logic may be
exercised using known data without the use of external components, although
at a limited speed dictated by the FASTBUS
data transfer.
Next: 5.10 Test Data Generator
Up: 5 Programmable Features
Previous: 5.8 Threshold disable